Defect Study on Deformed Fe-Si Alloys by Positron Annihilation Techniques

A set of Fe-Si samples with different Si content, varying from 0 to 7.6 wt.%, was investigated using positron annihilation spectroscopy. Different deformations were performed on these samples and the lineshape parameters of the annihilation line were measured in order to investigate the defects in the alloys. An exponential decay of the S-parameter in function of the time can be observed after deformation of the samples. The decay constant increases with increasing Si content. During the measurements of the samples with increasing Si content, the initiation of DO$\text{}_{3}$ structure can be seen above 5 wt.% of Si, as well as the decoration by impurities.